Nikon CF Plan 100x ELWD BD DIC Objective LEICA FOCUS MOUNTS LEICA which provides knurled X-Y controls

which provides knurled X-Y controls for precise specimen positioning while maintaining full rotational capability — essential for systematic petrographic examination and crystal orientation studies

5x factor reduces the effective magnification across the full zoom range by half

Semiconductor and wafer surface inspection

Eclipse Ni

Nikon CF Plan 100x ELWD BD DIC Objective LEICA FOCUS MOUNTS LEICA which provides knurled X-Y controlsNikon CF Plan 100X BD ELWD DIC Reflected Light Objective 100X Plan objective with BD + DIC brightfield, darkfield, and differential interference contrast in a single objective 2mm extra long working distance exceptional clearance at 100X for large or mounted specimens 0. 80 NA high resolution for reflected light surface imaging without immersion M25 thread, infinity corrected compatible with Nikon reflected light industrial microscopes Brightfield &